Chen, ShanzhiQin, Fei
Springer International Publishing (Cham, Switzerland , 2018) (eng) English9783319612010SpringerBriefs in electrical and computer engineering1st ed. COMPUTER NETWORKS; UnknownThis thesis provides a thorough noise analysis for conventional CIS readout chains, while also presenting and discussing a variety of noise reduction techniques that allow the read noise in standard processes to be optimized. Two physical implementations featuring sub-0.5-electron RMS are subsequently presented to verify the proposed noise reduction techniques and provide a full characterization of a VGA imager. Based on the verified noise calculation, the impact of the technology downscaling on the input-referred noise is also studied. Further, the thesis covers THz CMOS image sensors and presents an original design that achieves ultra-low-noise performance. Last but not least, it provides a comprehensive review of CMOS image sensors.
Physical dimension
1 online resource (xiv, 77 p.)Unknownill. (in color.)
Summary / review / table of contents
Introduction --
Low-Noise CMOS Image Sensors --
Noise Sources and Mechanisms in CIS --
Detailed Noise Analysis in Low-Noise CMOS Image Sensors --
Noise Reduction in CIS Readout Chains --
Design of a Sub-electron Readout Noise Pixel in a Standard CIS Process --
Characterization of a Sub-electron Readout Noise VGA Imager in a Standard CIS Process --
A Passive Switched-Capacitor Circuit For Correlated Multiple Sampling --
Downscaling Effects Towards Photon Counting Capability in CIS --
An Ultra Low Noise CMOS THz Imager -- Conclusion.